inspect 04 2017
Publishing Date: 04.09.2017
inspect – the number one magazine for applied imaging and optical metrology: information about new developments, technological trends, groundbreaking applications, new products.
Closing date for ads: 15 August 2017
Preview issue 4:
Embedded Vision Europe
Coordinate Measuring Technology
X-Ray, Hyperspectral Imaging, IR
YXLON: Quality assurance in additive-production using CT
MÄRKTE & MANAGEMENT
Orderfox: New online database for CNC manufacturer
VDMA: Perspectives for machine vision
IDS: Interview - USB 3.1 – The next generation of camera interface?
MBJ: Illumination for IR applications
MVTec / Ximea: Current developments in hyperspectral imaging
Perception Park: Chemical colour imaging for industrial applications
Xilinx: FPGAs in embedded vision architectures
Siemens: Object identification and product tracing using optical identification
Fraunhofer: Applications of industrial X-Ray imaging.
Mitutoyo: CMM application
Optris: The “Thermal Fingerprint” –Injection Molding in the Focus of Industry 4.0
Trioptics: MTF-measurements within the IR range
Volume Graphics: New software for the simulation of structure mechanics
Werth: Process validation for plug connectors using optical sensors and computer tomography
Zeiss IMT: Interview: The interconnected measuring room.
Polytec: Hyperspectral imaging in agriculture
inspect: Embedded Vision Europe – Preview
inspect: Event calender 2017