Archived print edition

inspect 04 2017

Publishing Date: 04.09.2017

inspect – the number one magazine for applied imaging and optical metrology: information about new developments, technological trends, groundbreaking applications, new products.

Closing date for ads: 15 August 2017
Contact: Oliver.Scheel@Wiley.com

Preview issue 4:

Trade Shows:
Motek
Embedded Vision Europe

Topics:
Coordinate Measuring Technology
Embedded Vision
X-Ray, Hyperspectral Imaging, IR
 

CONTENT

COVERSTORY
YXLON:  Quality assurance in additive-production using CT

MÄRKTE & MANAGEMENT
Orderfox:  New online database for CNC manufacturer
VDMA:  Perspectives for machine vision

VISION
IDS:  Interview - USB 3.1 – The next generation of camera interface?
MBJ:  Illumination for IR applications
MVTec / Ximea:  Current developments in hyperspectral imaging
Perception Park:  Chemical colour imaging for industrial applications
Xilinx:  FPGAs in embedded vision architectures

AUTOMATION
Siemens:  Object identification and product tracing using optical identification

CONTROL
Fraunhofer:  Applications of industrial X-Ray imaging.
Mitutoyo:  CMM application
Optris:  The “Thermal Fingerprint” –Injection Molding in the Focus of Industry 4.0
Trioptics:  MTF-measurements within the IR range
Volume Graphics:  New software for the simulation of structure mechanics
Werth:  Process validation for plug connectors using optical sensors and computer tomography
Zeiss IMT:  Interview: The interconnected measuring room.

NON MANUFACTURING
Polytec:  Hyperspectral imaging in agriculture

VISION PLACES
inspect:  Events
inspect:  Embedded Vision Europe – Preview
inspect:  Event calender 2017

 

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