May. 03, 2017

Second EMVA Forum ‘Control Vision Talks’ for Machine Vision and Optical Metrology at Control 2017

The Control show organizer and the European Machine Vision Association continue their partnership and realize the second edition of the presentation forum ‘Control Vision Talks’ during the 31th Control – International trade fair for quality assurance from 09 - 12 May 2017 in Stuttgart under the expert guidance of the EMVA.

These second ‘Control Vision Talks’ will be held in Hall 6 / Booth 6529 during the first three show days and offer more than 35 presentations on applied machine vision and optical metrology for quality assurance in German and English language. Each of the days has a special thematic priority: 

Tuesday, 09 May:  World of 3D: From 6-DoF to Point Cloud
Wednesday, 10 May:  Optical Metrology: Offline – At line – Inline
Thursday, 11 May:  Metrology throughout the whole spectrum: From Infrared
  to Hyperspectral 

The ‘Control Vision Talks’ aim to demonstrate the advantages of machine vision and optical metrology for quality assurance in an application-oriented manner. Trade fair visitors have free access to the presentations and do not need to register.

More information and the download link of the 2017 program can be found here.


emva European Machine Vision Association
Gran Via de Carles III, 84 (3rd floor)
08028 Barcelona
Phone: +34 931 807060
Telefax: +34 931 807060

Register now!

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