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Automatic Defect Review
Detecting and Classifying Defects via Atomic Force Microscopy
Automatic defect review with atomic force microscopy visualizes defects in three dimensions and therefore qualifies as ideal technique for the semiconductor industry. …
Miniaturized Piezo Tube Actuators in Scanning Probe Microscopy
Piezo tubes position measuring tip and sample in AFM
Mini piezo tubes enable highly dynamic, compact, and ultra-precise AFM processes. Find out more about the use of miniaturized piezo components here. …
Stemmer Imaging with new CEO
Arne Dehn will take over the position of CEO Stemmer Imaging AG from current CEO Christof Zollitsch
Christof Zollitsch will resign from the Executive Board at his own request and will contribute his experience and expertise as a stategic consultant. …
inspect international 01 2019 on the horizon
inspect team prepares new issue of inspect international
This time, our broad range of topics has a focus on 3D technology, yet also covering what´s in in the industry, such as robotics, and deep learning. …
The winners of the inspect award 2019
Baumer CX series and XRH RobotStar from Visiconsult win in their categories
During a ceremony on the Vision, the winners of the inspect Award 2019 were presented at the inspect booth …
EU initiative to promote networking at VISION
Organisation of meetings with suitable partners
Matchmaking programme facilitates initiation of international business …

Automatic Defect Review
Miniaturized Piezo Tube Actuators in Scanning Probe Microscopy
Stemmer Imaging with new CEO
inspect international 01 2019 on the horizon
The winners of the inspect award 2019
EU initiative to promote networking at VISION

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inspect international 02 2019

inspect international 02 2019

Publishing Date: 28.09.2019
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