Nanovea Profilometers are designed with leading edge Chromatic Confocal optical technology (axial chromatism) both ISO and ASTM compliant. The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions. There is no influence on accuracy from sample’s reflectivity, no need for frequent calibrations and no effects due to changes in measurement parameters.


6 Morgan Ste 156
92618 Irvine, CA
United States of America
Phone: 9494619292

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