From silicon semiconductor manufacture and corrosion analysis, to even archaeological investigations: Surface metrology is rapidly emerging as a vital analytical technique to determine the materials' topology. This technique requires the use of a microscope able to accurately and repeatedly visualize even the minutest of details: a measuring confocal laser scanning microscope.
more
Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces.
Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained.
more