23.07.2010

Polarizing Technics

From silicon semiconductor manufacture and corrosion analysis, to even archaeological investigations: Surface metrology is rapidly emerging as a vital analytical technique to determine the materials' topology. This technique requires the use of a microscope able to accurately and repeatedly visualize even the minutest of details: a measuring confocal laser scanning microscope. more07.07.2010

NPL uses Olympus LEXT OLS4000

Olympus has today announced that the National Physical Laboratory (NPL) is using its LEXT OLS4000 in a project to establish good practice guidelines for the calibration of 3D/areal surface texture measuring instruments. The NPL project will establish robust and easy to use calibration steps and reference standards for all the major areal surface measurement instrumentation technologies, with the LEXT chosen as the reference imaging confocal microscope. more08.12.2009

Olympus Enters Cooperation to Assist Users of Optical Measurement Equipment

The Olympus LEXT OLS4000 has been chosen by Germany's national metrology institute, the PTB, for use in a joint project that aims to develop an assistance system for confocal and interferential microscope users. As an advanced example of the instrumentation that the "Optassyst" project focuses on, the LEXT OLS4000 will help to provide measurements to check the specifications of standards and measurement procedures. more