From silicon semiconductor manufacture and corrosion analysis, to even archaeological investigations: Surface metrology is rapidly emerging as a vital analytical technique to determine the materials' topology. This technique requires the use of a microscope able to accurately and repeatedly visualize even the minutest of details: a measuring confocal laser scanning microscope.
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The new Olympus FluoView FV10i confocal laser scanning microscope system brings a whole new level of accessibility to confocal microscopy. It is designed to remove all of the complex steps involved in setting-up and using confocal microscopes, ensuring that users can concentrate on the images and data without any prior expertise.
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