LayTec is a provider of in-situ optical metrology systems for thin-film processes. The tools are used for thin-film applications such as compound semiconductors, photovoltaic, oxide and organic deposition. Measurement techniques as reflectometry, emissivity corrected pyrometry, laser deflectometry, reflectance anisotropy spectroscopy, are combined to create our series of products to provide access to all key thin-film parameters in real-time - during the deposition process or in-line.